history of

11th International Seminar
on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation

Brno, Czech Republic, July 14-18, 2008

LIST OF PARTICIPANTS
Adamec PavelIntegrated Circuit Testing GmbH, Heimstetten, Germany
Anger PascalCARL ZEISS SMT AG, Oberkochen, Germany
Barrett NicholasCEA/IRAMIS, Gif sur Yvette, France
Bärtle Janpro-beam AG&Co.KGaA, Planegg, Germany
Bernheim MarcCNRS/University Paris Sud, Orsay, France
Čižmár PetrNIST, Gaithersburg, USA
Cubric DaneShimadzu Research Laboratory, Manchester, United Kingdom
Delong ArminDelong Instruments Ltd., Brno, Czech Republic
Dupák LiborInstitute of Scientific Instruments ASCR, v.v.i., Brno, Czech Republic
Dvořáková MarieInstitute of Scientific Instruments ASCR, v.v.i., Brno, Czech Republic
Frank LuděkInstitute of Scientific Instruments ASCR, v.v.i., Brno, Czech Republic
Frase Carl GeorgPTB Braunschweig, Germany
Greenfield DmitryA.M. Prokhorov General Physics Institute RAS, Moscow, Russia
Hahn MichaelaUniversity of Mainz, Germany
Hendrich ChristianCARL ZEISS SMT AG, Oberkochen, Germany
Hoang Hung QuangNational University of Singapore
Horáček MiroslavInstitute of Scientific Instruments ASCR, v.v.i., Brno, Czech Republic
Hovorka MilošInstitute of Scientific Instruments ASCR, v.v.i., Brno, Czech Republic
Jánský PavelInstitute of Scientific Instruments ASCR, v.v.i., Brno, Czech Republic
Janzen RolandJanzen Consulting, Lorsch, Germany
Kemen ThomasCARL ZEISS SMT AG, Oberkochen, Germany
Khursheed AnjamNational University of Singapore
Konvalina IvoInstitute of Scientific Instruments ASCR, v.v.i., Brno, Czech Republic
Kumashiro SumioShimadzu Research Laboratory, Kyoto, Japan
Lencová BohumilaInstitute of Scientific Instruments ASCR, v.v.i., Brno, Czech Republic
Lopour FilipTESCAN Ltd., Brno, Czech Republic
Löwer Thorstenpro-beam AG&Co.KGaA, Planegg, Germany
Lushchyk PavelUniversity of Mainz, Germany
Maňkoš MariánKLA-Tencor, San Jose, USA
Merkel MichaelFOCUS GmbH, Hünstetten, Germany
Mika FilipInstitute of Scientific Instruments ASCR, v.v.i., Brno, Czech Republic
Mikmeková ŠárkaInstitute of Scientific Instruments ASCR, v.v.i., Brno, Czech Republic
Monastyrskiy MikhailA.M. Prokhorov General Physics Institute RAS, Moscow, Russia
Mullerova IlonaInstitute of Scientific Instruments ASCR, v.v.i., Brno, Czech Republic
Munro EricMunro`s Electron Beam Software Ltd., London, United Kingdom
Novák LiborInstitute of Scientific Instruments ASCR, v.v.i., Brno, Czech Republic
Ose YoichiHitachi High-Technologies, Ibaraki, Japan
Osterberg MansNational University of Singapore
Plies EricUniversity of Tűbingen, Germany
Preikszas DirkCARL ZEISS SMT AG, Oberkochen, Germany
Radlička TomášInstitute of Scientific Instruments ASCR, v.v.i., Brno, Czech Republic
Rochow ChristophUniversity of Tűbingen, Germany
Rögner Frank-HolmFraunhofer-Institut FEP Dresden, Germany
Rose HaraldUniversity of Technology, Darmstadt, Germany
Schröppel BirgitUniversity of Tűbingen, Germany
Schubert StefanCARL ZEISS SMT AG, Oberkochen, Germany
Shadman KhashayarKLA-Tencor, San Jose, USA
Spehr RainerInstitute of applied physics, Darmstadt, Germany
Sudakov MikhailUniverzity of Ryazan, Russia
Toth GaborKLA-Tencor, San Jose, USA
Vlček IvanInstitute of Scientific Instruments ASCR, v.v.i., Brno, Czech Republic
Walker AndrewShimadzu Research Laboratory, Manchester, United Kingdom
Weber NilsFOCUS GmbH, Hünstetten, Germany
Zadražil MartinTESCAN Ltd., Brno, Czech Republic
Zobač MartinInstitute of Scientific Instruments ASCR, v.v.i., Brno, Czech Republic
SCHEDULE

Monday July 14

 Arrival
19.00Welcome Party

Tuesday July 15

08.30Breakfast
09.30Seminar Session I: Frontiers in Electron Microscopy
 Rose Harald: The Route towards Sub-Angstroem Low-Voltage Electron Microscopy
 Müllerová Ilona: Low Energy Electron Microscopy in Material Science
11.00Coffee Break
11.30Seminar Session II: Advances in SEM Methods
 Frase Carl Georg: Modular Monte Carlo Simulation Including Secondary Electron Raytracing
 Čižmár Petr: Compensation for Drift and Vibrations in SEM
 Novák Libor: Signal Transport in Scintillation Detectors of Secondary Electrons in SEM
13.00Lunch
14.30Seminar Session III: LEEM & PEEM
 Barrett Nicholas: Aspects of Lateral Resolution Using Energy Filtered Core Level Photoelectron Emission Microscopy
 Merkel Michael: Hard X-Ray Photoelectron Spectroscopy Up to 15 keV: Recent Developments and Results with a Novel Instrument
 Maňkoš Marian: Low Energy Electron Microscopy for Semiconductor Applications
16.00Coffee Break
16.30Seminar Session IV: Poster Presentation
 Oral presentation of posters by authors in the lecture room, up to 5 min each.
A discussion will take place in front of the posters after the presentations (up to 18.30).
19.00 Open-Air Barbecue

Wednesday July 16

08.30Breakfast
09.30Seminar Session V: LEEM & PEEM Design
 Bernheim Marc: Surface Imaging with Electrostatic Cathode Lenses: Simulations and Experiments for Several Practical Conditions
 Weber Nils: PEEM with Two Complementary Electron Energy Filters: ToF and Retarding Field Analyser
 Janzen Roland: Setting Up a Picosecond Electron Source by Compressing Pulses of a Photo Emission Cathode
11.00Coffee Break
11.30Seminar Session VI: Electron Optical Computations
 Munro Eric: Design of Aberration Correctors Using the Differential Algebra Method
 Lencová Bohumila: Solving Complex Electron Optical Problems with EOD
 Radlička Tomáš: High-Order Field Derivatives for Computation of Aberrations
13.00Lunch
14.15Trip

Thursday July 17

08.30Breakfast
09.30Seminar Session VII: Novel Computation Problems
 Sudakov Mikhail: Simulations of Space-Charge Phenomena in Ion Traps and TOF Mass Spectrometers with the Use of FMM
 Monastyrskiy Mikhail: A Unified Aberration Theory of Narrow and Wide Beams: Tensor Version of the Tau-Variation Approach
 Greenfield Dmitry: Perturbation Methods of Electric and Magnetic Field Modeling in Charged Particle Optics
11.00Coffee Break
11.30Seminar Session VIII: Advanced Designs
 Cubric Dane: Design and Applications of Novel Charged Particle Energy Analysers
 Kursheed Anjam: A Second-Order Focusing Toroidal Spectrometer.
 Konvalina Ivo: Signal Collection with Secondary Electron Detectors in SEM
13.00Lunch
14.30Seminar Session XI: Trends in Electron Beam Welding
 Dupák Libor: Electron Beam Welding: Principles and Applications
 Zobač Martin: Electron Beam Welding in ISI Brno: Past&Present
 Bärtle Jan: Modern Electron Beam Welding Technology
16.00Coffee Break
16.30Seminar Session X: Future Trends
 Plies Erich: Modern Applications of the Ancient Wien Filter
 Delong Armin: Can the Low Voltage TEM Replace 200 - 400 keV TEMs in Biological Research?
19.00Farewell Dinner

Friday July 18

07.00Breakfast
 Departure
POSTERS
Posters:
Greenfield Dmitry:The Advance in Three-Dimensional Boundary Elements Method: Surface Charge Singularities in the Presence of Dielectrics and Magnetic Materials
Hahn Michaela:A Conversion Electron Mössbauer Spectrometer for the Analysis of Mars-Analogue Samples
Hoang Hung Quang:Experimental Results from a Magnetic Beam Sperator Energy Spectrometer in the SEM
Horáček Miroslav:Wien Filter Electron Optical Characteristics Determining Using Shadow Projection Method
Hovorka Miloš:Scanning Low Energy Electron Microscopy of Doped Silicon at Units of eV
Jánský Pavel:Numerical Simulations of Thermionic Electron Guns
Kursheed Anjam:Variable Magnetic Sector Field Electron Spectrometers for Parallel Energy Acquisition
Lushchyk Pavel:Time-Of-Flight and Spin-Filtering in Low-Energy Electron Microscopy
Monastyrskiy Mikhail:Coulomb Dynamics of Femtosecond Electron Bunches in Time-Depending Electric Fields
Osterberg Mans:A Chromatic and Spherical Aberration Corrected PEEM
Rochow Christoph:A Miniaturized Electron Optical Column with an Electrostatic-Permanent Magnetic Objective Lens
Schröppel BirgitAn Advanced Ion Guide for a Dedicated Imaging SIMS
Walker Andrew:Results from a New High Spatial Resolution SAM/SEM Electrostatic Column
ORGANIZING COMMITTEE
Dr. Filip Mika, Dr. Ilona Müllerová, Dr. Luděk Frank, Prof. Bohumila Lencová, Dr. Ivo Konvalina, Mgr. Libor Novák, Mgr. Miloš Hovorka