history of

5th International Seminar
on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation

Brno, Czech Republic, June 24 - 28, 1996
LIST OF PARTICIPANTS
name institution country
Prof. Rudolf Autrata ISI Brno Czech Republic
Dr. Marc Op de Beeck University of Antwerp Belgium
Dr. Ralf Degenhard Fritz-Haber-Institut der MPG Berlin, Germany
Prof. Armin Delong Delong Instruments Ltd. Brno, Czech Republic
Dr. Mohamed M. El Gomati University of York United Kingdom
Dr. Wilfried Engel Fritz-Haber-Institut der MPG Berlin, Germany
Dr. Rainer Fink Universität Würzburg Germany
Dr. Luděk Frank ISI Brno Czech Republic
Dr. Karel Hladil Delong Instruments Ltd. Brno, Czech Republic
Piotr Jedrasik University of Antwerp Belgium
Martin Klvač ISI Brno Czech Republic
Robert Kolařík Masaryk University Brno, Czech Republic
Dr. Vladimír Kolařík Delong Instruments Ltd. Brno, Czech Republic
Dr. Helmut Kuhlenbeck Ruhr-Universität Bochum Germany
Dr. Bohumila Lencová ISI Brno Czech Republic
Dr. Gerhard Lilienkamp Technishe Universität Clausthal Germany
Daniel Madea ISI Brno Czech Republic
Prof. Tom Mulvey Aston University Birmingham, United Kingdom
Heiko Müller Technishe Hochschule Darmstadt, Germany
Dr. Ilona Müllerová ISI Brno Czech Republic
Dr. Petr Pavelka Delong Instruments Ltd. Brno, Czech Republic
David Pejchl ISI Brno Czech Republic
Dr. Dirk Preikszas Technishe Hochschule Darmstadt, Germany
Prof. Frank H. Read University of Manchester United Kingdom
Vladimír Romanovský ISI Brno Czech Republic
Prof. Harald Rose Technishe Hochschule Darmstadt, Germany
Dr. Petr Schauer ISI Brno Czech Republic
Prof. Gerd Schönhense University of Mainz Germany
Dr. Rainer Spehr Technishe Hochschule Darmstadt, Germany
Dr. Waclaw Swiech University of Mainz Germany
Jiří Špinka ISI Brno Czech Republic
Radovan Vašina Delong Instruments Ltd. Brno, Czech Republic
Markus Weiss Universität Würzburg Germany
Ralph Wichtendahl Fritz-Haber-Institut der MPG Berlin, Germany
Dr. Dieter Winkler Integrated Circuit Testing GmbH Heimstetten, Germany
SCHEDULE
Monday June 24
Arrival, Welcome party
Tuesday June 25
Topic: Electron optics I
Moderators: T. Mulvey, F. Read
Topic: Electron optics II
Moderators: B. Lencová, R. Degenhardt
Topic: High resolution microscopies and aberration correction methods
Moderators: H. Rose, M. Op de Beeck
Topic: Surface examination by using low energy particles
Moderators: G. Schonhense, W. Swiech
Open-air barbecue
Wednesday June 26
Topic: On PEEM-LEEM spectro-microscopy
Moderators: G. Lilienkamp, R. Degenhardt, H. Rose
Trip across the highlands, session with Moravian wine
Thursday June 27
Topic: New insights into EM methods
Moderators: A. Delong, M. Op de Beeck
Topic: Signal detection in EM 
Moderators: R. Autrata, P. Schauer
Topic: Probe microscopies
Moderators: G. Schonhense
Poster discussion
Topic: Electron optics 
Moderator: T. Mulvey
Topic: Surface science 
Moderator: G. Schonhense
Topic: Instrumentation 
Moderator: H. Rose
Moravian folk music concert
Friday June 28
Departure to Brno 
POSTERS
Electron Optics:
 
Ol R. KOLAŘÍK and M. LENC Expression of resolving power of a simple optical system
O2 B. LENCOVÁ and l. ZLÁMAL Selected recent results of electron optical computations
O3 H. MÜLLER, D. PREIKSZAS and H. ROSE Semi-analytical fringing field calculation and design aspects of a magnetic beam separator
O4 D. PREIKSZAS and H. ROSE Conditions for correcting a round lens by an electron mirror
O5 F. H. READ Accuracy tests of the boundary charge method

Instrumentation:
 
Il R. AUTRATA, J. JIRÁK and J. ŠPINKA Charging effect problems in ESEM conditions
I2 R. DEGENHARDT and W. ENGEL Calculation, analysis and evaluation of the transfer optics optimized for a corrected imaging energy filter
I3 W. ENGEL et al. Design of a new photoemission spectro-microscope for BESSY II
I4 P. JEDRASIK On limitations of the charged particle systems in the nanolithographic fabrication
I4 M. KLVAČ and V. ROMANOVSKÝ Integrated scintillation and ionization detector for ESEM
I5 D. MADEA Low-energy electron single crystal detector efficiency
I6 P. PAVELKA Specimen manipulator for UHV deposition and measurement apparatus
I7 P. SCHAUER and R. AUTRATA Computer Designed Scintillation Detectors for SEM

Surface Science:
 
Sl I. MÜLLEROVÁ and L. FRANK Contrast mechanisms at low energies in SEM
S2 D. PEJCH and I. MÜLLEROVÁ Imaging with slow electrons in SEM
S3 M. ZADRAŽIL and L. FRANK Imaging of non-conductiong specimens by non-charging scanning electron microscopy method
S4 W. SWIECH et al. m -XAFS and m -XCMD with a PEEM in the secondary yield mode
S5 R. VAŠINA and V. KOLAŘÍK Materials Science at ELETTRA: Purpose, design and prospects
S6 M. WEISS, R. FINK and E. UMBACH An improved Auger microprobe using direct undulator radiation

ORGANIZING COMMITTEE
Dr. Ilona Mullerová, Dr. Luděk Frank, Dr. Petr Schauer, David Pejchl, Daniel Madea, Martin Zadražil