history of

4th International Seminar
on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation

Brno, Czech Republic, September 5 - 9, 1994
LIST OF PARTICIPANTS
name institution country
Pavel ADAMEC Institute of Scientific Instmments, Bmo Czech Republic 
Rudolf AUTRATA Institute of Scientific Instruments, Brno Czech Republic
Matthias BAUER University of Tübingen Germany 
Alexander S. BERDNlKOV Institute for Anal. Instr., St. Petersburg Russia
Jaroslav CHMELÍK Institute of Scientific Instruments, Brno Czech Republic
Ralf DEGENHARDT Fritz-Haber-Institut der MPG Berlin, Germany 
Armin DELONG Institute of Scientific Instruments, Brno Czech Republic 
Wolfgang DRIESEL Max-Planck-Institut für Mikrostrukturphysik Halle (Saalle), Germany
Thomas DUDEN Tech. Universität Clausthal Germany 
Mohamed M. ELGOMATI University of York United Kingdom
Wilfried ENGEL Fritz-Haber-Institut der MPG Berlin, Germany 
Hans Peter FEUERBAUM Integrated Circuit Testing GmbH Heimstetten, Germany
Luděk FRANK Institute of Scientific Instruments, Brno Czech Republic 
Jurgen FROSIEN Integrated Circuit Testing GmbH Heimstetten, Germany
Werner GRAHNEIS Johannes Gutenberg-Universität Mainz Germany
Franz HASSELBACH University of Tübingen Germany
Jan HEJNA Technical University of Wroclaw Poland 
Takeo ICHINOKAWA Waseda University Tokyo, Japan
Jaroslav KLÍMA TESCAN Ltd. Brno, Czech Republic 
Vladimír KOLAŘÍK Delong Instruments Ltd. Brno, Czech Republic
Hubert KRAUS University of Tübingen Germany 
Bohumila LENCOVÁ Institute of Scientific Instruments, Brno Czech Republic
Gerhard LILIENKAMP Tech. Universität Clausthal Germany 
Daniel MADEA Institute of Scientific Instruments, Brno Czech Republic 
Ilona MÜLLEROVÁ Institute of Scientific Instruments, Brno Czech Republic
David PEJCHL Institute of Scientific Instruments, Brno Czech Republic
Dirk PREIKSZAS Tech. Hochschule Darmstadt Germany 
Stephan RASTOMJEE Fritz-Haber-Institut der MPG Berlin, Germany 
Bernd RAUSENBERGER Fritz-Haber-Institut der MPG Berlin, Germany
Harald ROSE Tech. Hochschule Darmstadt Germany 
Viatcheslav D. SATCHENKO Institute for Anal. Instr., St. Petersburg Russia
Petr SCHAUER Institute of Scientific Instruments, Brno Czech Republic
Witold SLÓWKO Technical University of Wroclaw Poland
Waclaw SWIECH University of Mainz Germany 
Kars Z. TROOST Philips Research Laboratories Eindhoven, The Netherlands
Katsushige TSUNO JEOL Ltd. Tokyo, Japan 
Lubomír TŮMA TESCAN Ltd. Brno, Czech Republic 
Stephan UHLEMANN Tech. Hochschule Darmstadt Germany 
Ivo VÁVRA Institute of Electrical Engineering, SAS Bratislava, Slovakia
Harald WACHENDORFER University of Tübingen Germany 
SCHEDULE
Monday September 5
Arrival, Welcome party 
Tuesday September 6
Theme: Detection of charged particles and the detector designs
Moderators: R.Autrata, J.Hejna 
Theme: Surface examination by using of low energy particles
Moderators: W.Engel, J.Frosien, T.lchinokawa, G.Lilienkamp 
Wednesday September 7
Theme: The electron optical concepts for high resolution microscopies, HR applications in material science
Moderators: H.Rose, K.Tsuno, l.Vávra 
Trip across the highlands, session with Moravian wine
Thursday September 8
Theme: Matter wave interferometry
Moderator: F.Hasselbach
Poster discussion 
Chairman: H.Rose
Theme: Comparison of surface analytical methods and scanning probe microscopies and their optimum combination
Moderators: M.M. ElGomati, T. Ichinokawa
Chamber concert (students of Brno Conservatory) 
Friday September 9
Departure to Brno
POSTERS
Berdnikov A.S. Improved algorithms for calculation of electrostatic fields with boundary element method
Yavor M.I., Berdnikov A.S. ISIOS, the program for analysis of optical properties of multistage static systems with imperfections
Satchenko V.D., Turtia S.B. New approaches to the solution of problem of synthesis for optimal multistage static mass and energy analyzers
ElGomati M.M. The miniaturisation of electron columns: recent development
Preikzas D. Outline of a corrected LEEM
Pejchl D., Müllerová I., Frank L., Kolařík V. Separation of primary and reflected electrons for very low energy SEM 
Müllerová I., Frank L. Examples of contrasts in the low energy SEM
Adamec P., Delong A., Lencová B. Electron lenses with permanent magnets
Driesel W. 1 MeV-TEM in situ investigations of operating liquid metal ion sources
EIGomati M.M. Sources of internal scattering in a single pass CMA
ElGomati M.M. The backscattering coefficient for low energy electrons
Madea D. Material and topographic contrast of BSE's
Rausenberger B. I(V)-"fingerprinting" using a LEEM-microscope as a technique for the chemical analysis of surface adsorbates with high spatial resolution. Does it work?
Slówko W. Quantitative topographical contrast in the SEM
Vávra I. Electron beam mixing of W1-xSix/Si multilayers
ORGANIZING COMMITTEE
Dr. Luděk Frank, Dr. Ilona Müllerová, Dr. Petr Schauer, David Pejchl, Daniel Madea