history of

9th International Seminar
on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation

Brno, Czech Republic, July 12-16, 2004

LIST OF PARTICIPANTS
Adamec PavelIntegrated Circuit Testing GmbH, Heimstetten, Germany
Arnold RainerCarl Zeiss NTS GmbH, Oberkochen, Germany
Barth JimDelft University of Technology, The Netherlands
Bärtle JanUniversity of Tűbingen, Germany
Berdnikov AlexanderInstitute of Analytical Instrumentation, St.Petersburg, Russia
Cubric Dane Shimadzu Research Laboratory, Manchester, United Kingdom
Čižmár PetrInstitute of Scientific Instruments, Brno, Czech Republic
Delong ArminDelong Instruments, Ltd., Brno, Czech Republic
Downset DavidUniversity of York, United Kingdom
El Gomati MohamedUniversity of York, United Kingdom
Escher MatthiasFocus GmbH, Hűnstetten-Görsroth, Germany
Frank LuděkInstitute of Scientific Instruments, Brno, Czech Republic
Frosien JűrgenIntegrated Circuit Testing GmbH, Heimstetten, Germany
Hild RüdigerOmicron Nano Technology GmbH, Taunusstein, Germany
Horáček MiroslavInstitute of Scientific Instruments, Brno, Czech Republic
Hrnčiřík PetrInstitute of Scientific Instruments, Brno, Czech Republic
Jirák Josef Institute of Scientific Instruments, Brno, Czech Republic
Kaiser WaldemarUniversity of Tűbingen, Germany
Khursheed AnjamNational University of Singapore
Knippelmeyer RainerCarl Zeiss SMS GmbH, Oberkochen, Germany
Kolařík VladimírDelong Instruments, Ltd., Brno, Czech Republic
Kollarčik Karel FEI Czech Republic s.r.o., The Czech Republic
Konvalina IvoInstitute of Scientific Instruments, Brno, Czech Republic
Lencová BohumilaInstitute of Scientific Instruments, Brno, Czech Republic
Lilienkamp GerhardTechnical University of Clausthal, Germany
Lopour FilipTESCAN, s.r.o., Brno, Czech Republic
Maňkoš MarianKLA-Tencor, San Jose, USA
Mika FilipInstitute of Scientific Instruments, Brno, Czech Republic
Munro EricMunro´s Electron Beam Software, London, United Kingdom
Műllerová IlonaInstitute of Scientific Instruments, Brno, Czech Republic
Neděla VilémInstitute of Scientific Instruments, Brno, Czech Republic
Oral MartinInstitute of Scientific Instruments, Brno, Czech Republic
Österberg MansNational University of Singapore
Preikszas DirkCarl Zeiss NTS GmbH, Oberkochen, Germany
Rauscher MichaelUniversity of Tűbingen, Germany
Read FrankUniversity of Manchester, United Kingdom
Rogers StevenApplied Materials, Rehovot, Israel
Romanovský VladimírUniversity of York, United Kingdom
Rose HaraldLawrence Berkeley National Laboratory, USA
Sarraf HamidUniversity of Chemical Technology, Prague, Czech Republic
Schauer PetrInstitute of Scientific Instruments, Brno, Czech Republic
Schönhense GerdUniversity of Mainz, Germany
Schubert StefanCarl Zeiss SMS GmbH, Oberkochen, Germany
Spehr ReinerInstitute of Applied Physics, Technical University Darmstadt, Germany
Spehr AndreaAccompanying person
Sudakov MichaelShimadzu Research Laboratory, Manchester, United Kingdom
Špinka JiříBrno Univestity of Technology, Czech Republic
Van Bruggen MartijnDelft University of Technology, The Netherlands
Vlček IvanInstitute of Scientific Instruments, Brno, Czech Republic
Wandrol PetrInstitute of Scientific Instruments, Brno, Czech Republic
Wang LipingMunro´s Electron Beam Software, London, United Kingdom
Zobačová JitkaInstitute of Scientific Instruments, Brno, Czech Republic
SCHEDULE

Monday July 12


Arrival
19.00 Welcome party

Tuesday July 13


08.30 Breakfast
09.30 Session honouring Professor Armin Delong
 (Frank L., Lencová B., Kolařík V., Delong A.)
11.00 Coffee break
11.30 Seminar session
 EM systems
 (Rose H., Rauscher M., Barth J.)
13.00 Lunch
14.30 Seminar session
 LEEM and SLEEM
 (Lilienkamp G., Maňkoš M., ElGomati M.M., Romanovský V.)
16.00 Coffee break
16.30 Seminar session
 Poster session (oral presentation of posters in lecture room, 5min. each)
 (moderated by G. Schönhense and L.Frank)
19.00 Open-air barbecue

Wednesday July 14


08.30 Breakfast
09.30 Seminar session
 Computations in electron optics
 (Read F., Berdnikov A., Barth J.)
11.00 Coffee break
11.30 Seminar session
 Photoemission spectromicroscopy
 (Schönhense G., Escher M.)
13.00 Lunch
14.15 Departure by bus to an excursion with dinner in (very) old brewery
21.00 Session with Moravian wine

Thursday July 15


08.30 Breakfast
09.30 Seminar session
 Computations in electron optics
 (Lencová B., Munro E., Sudakov M., Wang L.)
11.00 Coffee break
11.30 Seminar session
 Spectroscopic SEM
 (Khursheed A., Hild R., Hrnčiřík P.)
13.00 Lunch
14.30 Seminar session
 New elements and approaches
 (Cubric D., van Brugen M., Schauer P.)
16.00 Coffee break
16.30 Evening lecture
 (Rose H.)
18.30 Concert
20.00 Farewell dinner

Friday July 16


08.30 Breakfast
09.30 Departure
POSTERS
Oral presentations:
Barth J.: Practical Modeling of the Dependence of Electron Probe Instrument Performance on Source Brightness and Energy Spread
Berdnikov A.:3D BEM field solver with elimination of singularities near the surface
Cubric D.: On the performance of an energy filter for high brightness electron gun
Delong A.:Field emission cathodes for electron microscopes
El-Gomati M.:Secondary electron contrast of doped semiconductors: An update
Escher M.:NanoESCA: A novel energy filter for imaging XPS
Hild R.:NanoSAM: Scanning Auger with sub 10 nm resolution and variable beam energies
Khursheed A.:The spectroscopic scanning electron microscope (SPSEM)
Lencová B.:Recent development of software for particle optics
Lilienkamp G.: Application of the spectroscopic LEEM in catalysis and sensor technology
Maňkoš M.Low energy electron microscopy for high throughput applications
Munro E.:Simulation of curved axis systems
Rauscher M.:System performance of a dedicated low energy focussed ion beam system
Read F.:Simulation of electron and ion sources
Read F.: The ultimate accuracy of the BEM for electrostatics
Rose H.: Five-Dimensional Hamilton-Jacobi Approach to Relativistic Quantum Mechanics
Rose H.: Transmission Electron Aberration-Corrected Microscope
Romanovský V.:Electrostatic Low Energy Scanning Electron Microscope for Auger Analysis
Schauer P.:Experimental and simulative methods for scintillation detector optimization
Schönhense G.:Picosecond dynamics of magnetization processes observed using time-resolved X-PEEM
Sudakov M.:The analysis of SIMION 7.0: field errors in ion trap simulations
van Bruggen M.: Electron microlenses and microlens arrays
Wang L.: Simulation of multipole systems by differential algebraic method
Poster presentations:
Bärtle J.:A tool to calculate the paraxial properties of electron optical systems
Čižmár P.:The optical part of the multichannel electron energy analyzer
Hrnčiřík P.:Very low energy scanning electron microscope
Jirák J.:Signal detection using segmental ionization detector
Lencová B.:Selected examples of our computations
Khursheed A.: A 2D interactive mesh generator for Finite Element Programmes
Konvalina I.:Collection efficiency of the detector of secondary electrons in SEM
Mika F.:Contrast generation in low energy SEM imaging of doped semiconductor
Neděla V.:Optimalization of hydration conditions in ESEM
Österberg M.:An add-on spectrometer/lens-sector plate attachment for the SEM
Oral M.:Calculation of current density profiles of charged-particle beams
Read F.: A stable mode for an electrostatic storage ring
Schauer P.:Cathodoluminescence of polysilanes
Špinka J.: Humidity measurement and adjustment at environmental conditions
Vlček I.:Design of the low-voltage SEM
Wandrol P.:New type of YAG-II scintillator for nanoresolution BSE imaging in SEM
Wandrol P.:Trajectories od signal electrons in low-voltage BSE detector
ORGANIZING COMMITTEE
Dr. Ilona Müllerová, Dr. Luděk Frank, Dr. Petr Schauer, Mgr. Petr Čižmár, Ing. Ivo Konvalina, Ing. Petr Hrnčiřík