history of

7th International Seminar
on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation

Brno, Czech Republic, July 15-19, 2000

LIST OF PARTICIPANTS
nameinstitutioncountry
Dr. Pavel ADAMEC Integrated Circuit Testing GmbH Heimstetten, Germany
Dr. Ranjan BADHEKA Shimadzu Research Laboratory Manchester, United Kingdom
Dr. Jim BARTH University of Technology Delft, The Netherlands
Dr. Eva COUFALOVÁ Delong Instruments Res. Lab. Brno, Czech Republic
Prof. Armin DELONG Delong Instruments Ltd. Brno, Czech Republic
Prof. Mohamed M El GOMATI The University of York York, United Kingdom
Dr. Luděk FRANK Institute of Scientific Instruments Brno, Czech Republic
Volker GERHEIM Institute of Applied Physics Darmstadt, Germany
Peter HARTEL Institute of Applied Physics Darmstadt, Germany
Dr. Miroslav HORÁČEK Institute of Scientific Instruments Brno, Czech Republic
Dr. Otakar HUTAŘ Institute of Scientific Instruments Brno, Czech Republic
Dr. Marcus JACKA The University of York York, United Kingdom
Hirantha JAYAKODY The University of York York, United Kingdom
Dr. Vladimír KOLAŘÍK Delong Instruments Ltd Brno, Czech Republic
Jitka KÁŇOVÁ Institute of Scientific Instruments Brno, Czech Republic
Nelliyan KARUPPIAH Inst. of Mat. Research and Engineering Instrumentation Singapore
Dror KELLA Applied Materials GEM Israel
Dr. Sumio KUMASHIRO Shimadzu Research Laboratory Manchester, United Kingdom
Doc. Bohumila LENCOVÁ Institute of Scientific Instruments Brno, Czech Republic
Dr. Marian MAŇKOŠ Etec Systems Inc., Hayward, USA.
Dr. Gebhard MARX University of Mainz Mainz, Germany
Dr. Pier Giorgio MERLI CNR-LAMEL Bologna, Italy
Martin MICHÁLEK Institute of Scientific Instruments Brno, Czech Republic
Dr. Eric MUNRO MEBS Ltd. London United Kingdom
Heiko MULLER Institute of Applied Physics Darmstadt, Germany
Dr. Ilona MULLEROVÁ Institute of Scientific Instruments Brno, Czech Republic
Prof. Sergej NEPIJKO University of Mainz Mainz, Germany
Dr. Igor PETROV Applied Materials GEM Israel
Dr. Dirk PREIKSZAS Institute of Applied Physics Darmstadt, Germany
Vladimír ROMANOVSKÝ Institute of Scientific Instruments Brno, Czech Republic
Prof. Harald ROSE Institute of Applied Physics Darmstadt, Germany
John ROUSE MEBS Ltd. London United Kingdom
Dr. Jean-Luc ROUVIERE CEA Grenoble, France
Peter SCHORSCH Institute of Applied Physics Darmstadt, Germany
Dr. Rainer SPEHR Institute of Applied Physics Darmstadt, Germany
Dr. Radovan VAŠINA Delong Instruments Res. Lab. Brno, Czech republic
Dr. Andrew WALKER Shimadzu Research Laboratory Manchester, United Kingdom
Christoph WEISSBÄCKER Institute of Applied Physics Darmstadt, Germany
Martin ZADRAŽIL Tescan Ltd Brno, Czech Republic
SCHEDULE
Saturday, July 15
Arrival, registration
13:00 Lunch
14:30 Departure by bus for a trip across the highlands
19:00 Welcome party

Sunday, July 16
08:30 Breakfast
09:30 Topic: Electron optics I
Moderators: B. Lencová, J. Barth
11:00 Coffee break
11:30 Topic: EM systems at large X-ray sources
Moderators: H. Rose, V. Kolařík,G. Marx
13:00 Lunch
14:30 Topic: Surface examination methods
Moderators: M.M. ElGomati, S. Nepijko, A. Walker, M. Jacka
16:00 Coffee Break
16:30 Topic: Poster Session
Moderators: P.G. Merli, B. Lencová
19:00 Open-air barbecue (sponsored by Tescan Ltd, Brno)

Monday, July 17
08:30 Breakfast
09:30 Topic: Electron optical systems for semiconductor technologies
Moderators: M. Maňkoš, M.M. ElGomati, V. Kolařík, O. Hutař
11:00 Coffee break
11:30 Topic: Electron optics II
Moderators: E. Munro, D. Preikszas
13:00 Lunch
14:30 Departure by bus for a trip across the highlands with dinner in a rustic inn
21:00 Session with Moravian wine

Tuesday, July 18
08:30 Breakfast
09:30 Topic: General progress in Electron Microscopy
Moderators: H. Rose, A. Delong
11:00 Coffee break
11:30 Topic: Aberration correcting tools
Moderators: R. Spehr, P. Hartel, Ch. Weissbäcker
13:00 Lunch
14:30 Topic: Examination of "sharp features" in EM
Moderator: P. Merli, J.-L. Rouviere, M.M. ElGomati
16:00 Coffee Break
16:30 Topic: What inspiration have the instrument designers drawn from EUREM?
Moderators: H. Rose, A. Delong, L. Frank
19:00 Seminar dinner

Wednesday, July 19
08:30 Breakfast, departure.

 
POSTERS

 
Gerheim V. Quadrupole projector system with variable magnification for energy-filtering transmission electron microscopes.
Horáček M. Detection of the angular distribution of the signal electrons in VLESEM
Hutař O., Oral M., Müllerová I., Frank L. Dimension measurement in a cathode lens equipped low-energy SEM
Káňová J., Frank L. Signal detection near the critical energy of non-charging illumination in a low-energy SEM equipped with a cathode lens
Lencová B., Vlček I. Computations of Wien filter properties and aberrations
Lencová B., Zlámal J. New CAD program for the design in electron optics
Mynář M., Vašina R., Kolařík R., Lencová  B. Electron ray-tracing for numerical determination of aberration
Müller H., Schorsch P., Rose H. HREM image simulation and partial coherence
Müllerová I., Frank L. UHV equipment for surface examination by SLEEM and related methods
Romanovský V., Hutař O., Autrata R. Optimization of operating conditions of ionization detectors for environmental SEM
Schorsch P. An implementation of the Coherence Function Multislice Method
Vašina R., Doležal P., Vondráček M. Recent results of Materials Science Beamline
M. Jacka, A. Kale, M. Tyndall, M. Prutton Auger microscopy with a parallel acquisition spectrometer
ORGANIZING COMMITTEE
Dr. Ilona Müllerová, Dr. Luděk Frank, Dr. Petr Schauer, Ing. Jitka Káňová, Ing. Vladimír Romanovský, Ing. Martin Michálek