history of

6th International Seminar
on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation

Brno, Czech Republic, June 29 - July 3, 1998

LIST OF PARTICIPANTS
name institution country
Dr. Pavel ADAMEC ICT GmbH Heimstetten, Germany
Dr. Jim E. BARTH Delft University of Technology The Netherlands
Dr. Johannes BIHR LEO Ltd. Oberkochen, Germany
Dr. Eva COUFALOVÁ Delong Instruments Res. Lab. Ltd Brno, Czech Republic
Dr. Julian DAVEY LEO Electron Microscopy Ltd. Cambridge, England 
Prof. Armin DELONG Delong Instruments Ltd. Brno, Czech Republic 
Dr. Mohamed M. El GOMATI University of York England 
Dr. Luděk FRANK Institute of Scientific Instruments Brno, Czech Republic 
Volker GERHEIM Technische Hochschule Darmstadt, Germany 
Peter HARTEL Technische Hochschule Darmstadt, Germany 
Dr. Franz HASSELBACH Universität Tübingen Germany 
Dr. Jan HEJNA Wroclaw University of Technology Poland 
Dr. Karel HLADIL Delong Instruments Res. Lab. Ltd. Brno, Czech Republic 
Dr. Otakar HUTAŘ Institute of Scientific Instruments Brno, Czech Republic 
Dr. Ronald JANZEN LEO GmbH Germany 
Dr. Josef JIRÁK Technical University Brno Czech Republic 
Frank KAHL Technische Hochschule Darmstadt, Gecmany 
Martin KLVAČ Institute of Scientific Instruments Brno, Czech Republic 
Robert KOLAŘÍK Masaryk University Brno, Czech Republic 
Dr. Vladimír KOLAŘÍK Delong Instruments Ltd. Brno, Czech Republic 
Dr. Bohumila LENCOVÁ Institute of Scientific Instruments Brno, Czech Republic 
Dr. Gerhard LILIENKAMP Technische Universität Clausthal Germany 
Prof. Genoveva MARTINEZ Universidad Complutense Madrid, Spain 
Dr. Michael MERKEL FOCUS GmbH, Hünstetten-Görsroth Germany 
Martin MICHÁLEK Institute of Scientific Instruments Brno, Czech Republic 
Dr. Eric MUNRO Munro's Electron Beam Software Ltd. London, England 
Heiko MÜLLER Technishe Hochschule Darmstadt, Gertnany 
Dr. Ilona MÜLLEROVÁ Institute of Scientific Instruments Brno, Czech Republic 
Dr. Igor PETROV Opal Nes-Ziona, Israel 
Sigrid PLANCK ACT GmbH Germany 
Dr. Dirk PREIKSZAS Technishe Hochschule Darmstadt, Germany 
Vladimír ROMANOVSKÝ Institute of Scientific Instruments Brno, Czech Republic 
Prof. Harald ROSE Technische Hochschule Darmstadt, Germany 
Dr. Petr SCHAUER Institute of Scientific Instruments Brno, Czech Republic 
Peter SCHMID Technische Hochschule Dartnstadt, Germany 
Prof. Gerd SCHÖNHENSE Universität of Mainz Germany 
Prof. Witold SLÓWKO Wroclaw University of Technology Poland 
Peter SONNENTAG Universität Tübingen Germany 
Dr. Rainer SPEHR Technische Hochschule Darmstadt, Germany 
Richard STEKLÝ Institute of Scientific Instruments Brno, Czech Republic 
Jiří ŠPINKA Technical University Brno Czech Republic 
Dr. Katsu TSUNO JEOL Ltd. Tokyo, Japan 
Dr. Luboiš TŮMA LEO Electron Microscopy Ltd. Brno, Czech Republic 
Tomáš TYC Masaryk University Brno, Czech Republic 
Christoph WEISSBAECKER Technische Hochschule Darmstadt, Germany 
Martin ZADRAŽIL Institute of Scientific Instruments, Brno Czech Republic 
SCHEDULE
Monday June 29
Arrival, Welcome party 
Tuesday June 30
Topic: High resolution microcopies and aberration correction methods
Moderator: H. Rose
Introductory talk:
H. Rose: Ultimate resolution: what are the needs for future microscopes?
Topic: Electron optics I
Moderators: B. Lencová, E. Munro
Introductory talks:
B.Lencová: New trends in software for electron optics
E. Munro: A study of ways of improving the speed and accuracy of computing fields, trajectories and aberrations in electron optics
Topic: Electron optics II
Moderators: K.Tsuno, G. Martinez
Introductory talk:
K. Tsuno: An E+B+E beam separator for detecting secondary electrons in low voltage SEM
G. Martinez: Optimal synthesis of charged beam focusing systems
Topic: Electron optics III
Moderators: J. Barth, F Kahl
Introductory talks:
J.Barth: Application of a two parameter bell distribution in charged particle optics
R Kahl: Outline of an electron monochromator with smart Boersch effect
Open-air barbecue (partially supported by LEO Electron Microscopy Ltd. Brno)
Wednesday July 1
Topic: Poster section I (Electron optics, posters E01, E06, E07, E010-E012)
Moderators: H. Rose, B. Lencová
Topic: Poster section II (Electron optics, posters E02-E05, E08, E09)
Moderators: K Tsuno, E. Munro
Topic: Poster section III (Instrumentation, posters I1-I5)
Moderators: A. Delong, F Hasselbach
Topic: Poster section IV (Surface science, posters S1-S6)
Moderators: G. Schonhense, M. Gomati
Trip across the highlands, session with Moravian wine
Thursday July 2
Topic: Electron and ion interferometry
Moderators: F. Hasselbach, P.Sonnentag, T. Tyc
Introductory talks:
F. Hasselbach: Recent advances in ion- and electron-biprism interferometry
P. Sonnentag: On the theoretical understanding of the Wien filter in an electron biprism interferometer
T. Tyc: Antibunching of electrons as a consequence of the indistinguishableness of fermions
Topic: Special techniques in the SEM
Moderators: W. Slówko, P. Schauer
Introductory talks:
W. Slówko: Three dimensional scanning electron microscopy
P. Schauer: Cathodoluminescent properties of single crystals for S(T)EM detectors
Topic: Surface examination by using low energy particles I
Moderators: H. Rose, M.M. ElGomati
Introductory talks:
H. Rose: Surface examination by using low energy particles
M.M. ElGomati: Quantitative surface analysis at high spatial resolution
Topic: Surface examination by using low energy particles II
Moderators: G. Schonhense, I. Mullerová, L. Frank
Introductory talk:
G. Schonhense: Spectroscopic X PEEM with emphasis on magnetic contrast
Moravian folk music concert
Friday July 3
Departure to Brno
POSTERS
Electron Optics:
 
EOl Gerheitm V., H.Rose Quadrupole projector system with variable magnification for energy-filtering transmission electron microscopes
EO2 Hartel P., D. Preikszas, R. Spehr, H. Rose Test of a beam separator for a corrected PEEM/LEEM
EO3 Hejna J. Optimisation of an immersion lens design in the BSE detector for the low voltage SEM
EO4 Hutař O., R. Autrata The separation of secondary electrons in annular and planar detectors
EO5 Janzen R., E. Weimer Study of detection properties of a MEDOL/GEMINI objective lens for secondary electrons 
EO6 Kolařík R., M. I.enc Different ways of adding aberrations
EO7 Müller H., H. Rose A coherence function approach to multislice theory
EO8 Müllerová I., L. Frank, E.Weimer Variable mode retarding field element for Low-Energy SEM
EO9 Müllerová I., L. Frank Short note on Low-Energy SEM configurations
EO10 Preikszas D., P. Hartel, R. Spehr, H. Rose Construction of an electron-optical bench for testing a mirror corrector
EO11 Schmid P., H. Rose Outline of a variable-axis lens with arbitrary shift of the axis in one direction 
EO12 Spehr R. Variable axis lens with an extremely large scanning area in one direction 

Instrumentation:
 
Il Autrata R., J. Jirák, M. Klvač, V. Romanovský Detection of backscattered electrons in environmental SEM
I2 Autrata R., V. Romanovský, J.Jirák, M.Klvač Ionisation detector for the environmental SEM
I3 Autrata R., J.Jirák. M. Michálek, J. Špinka Amplification of signal electrons in gas environment
I4 Autrata R., J.Jirák. M. Michálek, J. Špinka Conditions for specimen observation in environmental SEM
I5 Delong A.. V. Kolařík, D.C. Martin Low voltage transmission electron microscope LVTEM-5 

Surface Science:
 
Sl Hutař O. Noncharging microscopy of semiconductor structures
S2 Lilienkamp G., Th. Schmidt, S. Satchenko, K. Prince, E. Bauer Spectroscopic imaging with the low energy electron microscope
S3 Merkel M., M. Escher, O. Schmidt, Ch. Ziethen, G. Schönhense The microanalytic prospects of a high resolution PEEM
S4 Steklý R., L. Frank., I. Müllerová Distributed Monte Carlo: smart way for computing complex problems
S5 Zadražil M., M.M. ElGomati Measurements of the secondary and backscattered electron coefficients in the very low energy range
S6 Zadražil M., L. Frank, J. Norris Imaging of non-conducting specimens by noncharging scanning electron microscopy with method for automatically adjusted critical energies

ORGANIZING COMMITTEE
Dr. Ilona Müllerová, Dr. Luděk Frank, Dr. Petr Schauer, Ing. Pavel Furch, Ing. Martin Zadražil, Richard Steklý