history of

3rd International Seminar
on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation

Brno, Czechoslovakia, June 15 - 19, 1992

LIST OF PARTICIPANTS
name institution country
Anger Klaus, Dr. SIEMENS Munchen, Germany 
Autrata Rudolf, Prof. Inst. Scient. Instr. Brno, Czechoslovakia 
Barth Jim, Dr. Delft Univ. of Technology The Netherlands 
Bauer Ernst, Prof. Tech. Universitat Clausthal Clausthal-Zellerfeld, Germany 
Cazaux Jacques, Prof. LASSI, GRSM Faculté des Sciences Reims-Cédex, France 
Delong Armin, Prof. Inst. Scient. Instr. Brno, Czechoslovakia 
Dhanak V.R., Dr Sincrotrone Trieste Trieste, Italy 
Drexel Volker Carl Zeiss Oberkochen, Germany 
Fišer Jan, Dr. Inst. Scient. Instr. Brno, Czechoslovakia 
Frank Luděk, Dr. Inst. Scient. Instr. Brno, Czechoslovakia 
Haider Max, Dr. EMBL Heidelberg, Germany 
Husták Jaromír, Dipl.lng. Inst. Scient. Instr. Brno, Czechoslovakia 
Chmelík Jaroslav, Dr. Delft Univ. of Technology The Netherlands 
Jiříček Petr, Dr. Inst. of Physics Prague, Czechoslovakia 
Kolařík Vladimír, Dr. Delong Instruments Brno, Czechoslovakia 
Konečný Pavel, Dr. Inst. Scient. Instr. Brno, Czechoslovakia 
Křivánek Ondřej,Dr. Gatan Inc.,R&D Pleasanton, USA 
Kruit Pieter, Prof. Delft Univ. of Technology The Netherlands 
Lenc Michal, Dr. Inst. Scient. Instr. Brno, Czechoslovakia 
Lencová Bohumila, Dr. Inst. Scient. Instr. Brno, Czechoslovakia 
Lilienkamp Gerhard, Dr. Tech. Universitat Clausthal Clausthal-Zellerfeld, Germany 
Maňkoš Marián Arizona State University,
Dept. of Phys.and Astronomy		 Tempe, USA 
Mullerová Ilona, Dr. Inst. Scient. Instr. Brno, Czechoslovakia 
Mulvey Tom, Prof. Aston University Dept.EI.Eng.and AppI.Phys. Birmingham, England 
Pavelka Petr, Dr. Inst. Scient. Instr. Brno, Czechoslovakia 
Pejchl David Inst. Scient. Instr. Královopolská Brno, Czechoslovakia 
Pinkvos Heiko, Dr. Tech. Universitat Clausthal Clausthal-Zellerfeld, Germany 
Preikszas Dirk, Dr.  Tech. Hochschule Darmstadt Darmstadt, Germany 
Rose Harald, Prof.  Tech. Hochschule Darmstadt Darmstadt, Germany 
Schaffer Peter, Dr. Carl Zeiss, Abt.MT-FLab. Oberkochen, Germany 
Swiech Waclaw, Dr. Fritz-Haber-Institut Berlin, Germany 
Troyon Michael. Prof. Lab. microsc. électr.,INSERM Reims, France 
Uhlemann Stephan, Dr. Tech. Hochschule Darmstadt Darmstadt, Germany 
van der Stam M.A.J., ir. Delft Univ. of Technology The Netherlands 
Viščor Petr, Dr. Roskilde University Center Roskilde, Denmark 
Tůma Lubomír Brno, CZ
Lenz Friedrich Thubingen, Germany
Klíma Jaroslav Brno, CZ
Očadlík Jiří Brno, CZ
Marx Gebhard Mainz, Germany
Eggert Frantz Berlin, Germany
SCHEDULE
Monday June 15
Arrival, Welcome party
Tuesday June 16
Introduction: Tom Mulvey 
Jim Barth: Charged particle optics design: methods and models
Bohumila Lencová: Recent progress in electron optical simulations
Pieter Kruit: Methods to measure amplitude and phase of the exit wave in TEM
Armin Delong: Low energy TEM
Vladimír Kolařík: TEM for surface examination. yes or not?
Ernst Bauer: Recent developments in LEEM 
Michal Lenc: The optical properties of the superposition of the electrostatic and magnetic fields 
Ilona Mullerová: Comparisons of the LEEM and scanning LEEM 
Harald Rose: Outline of a high-resolution LEEM 
Max Haider: A high resolution LVSEM for biological applications 
Jaromír Husták: The imaging with the very low energy electrons in the commercial mini SEM 
V. R. Dhanak: Properties of two hemispherical deflector analysers placed in tandem in a double pass configuration 
Waclaw Swiech: In-situ observation of surface transient phenomena at high gas pressures with LEEM 
Wednesday June 17
trip to some sights of Moravia, dinner with Moravian wine 
Thursday June 18
Jacques Cazaux: X-ray microscopy and microtomography in a SEM 
Luděk Frank: Backscattered electron spectroscopy as the thin film examination tool 
Jacques Cazaux: Auger backscattering factor and diameter 10) of EPMA 
Ondřej Křivánek: EELS chemical mapping in TEM and STEM 
Michael Troyon: Combination of STM and SEM 
Petr Viščor: Electrical impedance spectroscopy and physics of surfaces/interfaces 
Michael Troyon: Performances of an energy filtering FEG in LVSEM 
Pavel Konečný: Design problems of liquid metal ion guns 
Petr Pavelka: M-I-M and M-I-S electron sources 
Marian Maňkoš: High resolution techniques on a dedicated STEM with a new detector system 
Klaus Anger: Through lens secondary electron detection in a low energy scanning microscope 
Rudolf Autrata: Some problems of low energy backscattered electrons detection in SEM 
Jacques Cazaux: Twin angular detector in AES 
Chamber concert (students of Brno Conservatory) 
Friday June 19
Departure to Brno
POSTERS
Fišer J. Technical difficulties in the scanning LEEM design
Jiříček P. Transmission function of hemispherical analyser
Pejchl D. To the contrast mechanisms in very low energy SEM
Preikszas D. A mirror-hexapole corrector
Uhlemann S. Feasible concepts for beam splitters and energy filters
van der Stam M.A.J. Computer assisted engineering in charged particle optics
ORGANIZING COMMITTEE
Luděk Frank, Ilona Müllerová, Pavel Konečný, Jaromír Husták, David Pejchl, Ludmila Pečinková