history of

12th International Seminar
on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation

Brno, Czech Republic, May 31 - June 4, 2010

LIST OF PARTICIPANTS
Adamec PavelIntegrated Circuit Testing GmbH, Heimstetten, Germany
De Pietro LorenzoETH Zürich, Zürich, Switzerland
Delong ArminDelong Instruments, Ltd., Brno, Czech Republic
Feinäugle PeterFraunhofer-Institut FEP Dresden, Germany
Frank LuděkInstitute of Scientific Instruments ASCR, v.v.i. Brno, Czech Republic
Horáček MiroslavInstitute of Scientific Instruments ASCR, v.v.i. Brno, Czech Republic
Hovorka MilošInstitute of Scientific Instruments ASCR, v.v.i. Brno, Czech Republic
Janzen RolandJanzen Consulting, Lorsch, Germany
Jiruše JaroslavTESCAN a.s., Brno, Czech Republic
Kolařík VladimírDelong Instruments Ltd., Brno, Czech Republic
Konno ToyohikoIMR Tohoku University, Sendai, Japan
Konvalina IvoInstitute of Scientific Instruments ASCR, v.v.i. Brno, Czech Republic
Lencová BohumilaInstitute of Scientific Instruments ASCR, v.v.i. Brno, Czech Republic
Lopour FilipTescan, Ltd., Brno, Czech Republic
Marianowski KarinUniversity of Tűbingen, Tűbingen, Germany
Matějka MilanInstitute of Scientific Instruments ASCR, v.v.i. Brno, Czech Republic
Matsuda KenjiUniversity of Toyama, Toyama, Japan
Mika FilipInstitute of Scientific Instruments ASCR, v.v.i. Brno, Czech Republic
Müller HeikoCEOS GmbH, Heidelberg, Germany
Műllerová IlonaInstitute of Scientific Instruments ASCR, Brno, Czech Republic
Munro EricMunro's Electron Beam Software, London, United Kingdom
Ohnweiler TimmUniversity of Tűbingen, Tűbingen, Germany
Oral MartinInstitute of Scientific Instruments ASCR, v.v.i. Brno, Czech Republic
Pokorná ZuzanaInstitute of Scientific Instruments ASCR, v.v.i. Brno, Czech Republic
Preikszas DirkCarl Zeiss NTS GmbH, Oberkochen, Germany
Radlička TomášInstitute of Scientific Instruments ASCR, v.v.i. Brno, Czech Republic
Rodenburg CorneliaUniversity of Sheffield, Sheffield, United Kingdom
Rodenburg JohnUniversity of Sheffield, Sheffield, United Kingdom
Rose HaraldUniversity of Technology, Darmstadt, Germany
Sato KazuhisaIMR Tohoku University, Sendai, Japan
Schnell MichaelCarl Zeiss NTS GmbH, Oberkochen, Germany
Schubert KaiCarl Zeiss SMT AG, Oberkochen, Germany
Urbánek MichalInstitute of Scientific Instruments ASCR, v.v.i. Brno, Czech Republic
Vystavěl TomášFEI Company, Brno, Czech Republic
Zobačová JitkaInstitute of Scientific Instruments ASCR, v.v.i. Brno, Czech Republic
SCHEDULE

Monday May 31

 Arrival
20.00Welcome Party

Tuesday June 1

08.30Breakfast
09.30Seminar Session I: Dopant Mapping
 Rodenburg Cornelia: Energy Selective Secondary Electron Detection a Solution to Site Specific SEM Dopant Mapping
 Hovorka Miloš: Mapping of Dopants by Electron Injection
 Mika Filip: Imaging of Dopants under Presence of Surface Ad-layers
11.00Coffee Break
11.30Seminar Session II: Advanced SEMs I
 Müllerová Ilona: Transmission Mode in Scanning Low Enery Electron Microscope
 Matsuda Kenji: Superconductive Property and Microstructure of MgB2 / Al Composite Materials
 Hovorka Miloš: Prospects of the Scanning Low Energy Electron Microscopy in Materials Science
13.00Lunch
14.30Seminar Session III: Advanced SEMs II
 Pokorná Zuzana: Mapping the Local Density of States Above Vacuum Level by Low Energy Electron Reflectivity
 Sato Kazuhisa: Nanostructure and Morphology of Wood Carbon Observed by Low-Voltage Electron Microscopy
15.30Seminar Session IV: Poster Presentation
 Oral presentation of posters by authors in the lecture room, 5 - 7 min. each. A discussion and coffee will take place in front of the posters after the presentations (up to 17.00).
19.00 Open-Air Barbecue

Wednesday June 2

08.30Breakfast
09.30Seminar Session V: Electron Optics Without Lenses
 Rodenburg John: Transmission and Reflection Microscopy Without Lenses
 De Pietro Lorenzo: High Resolution Electron Microscopy via Localized Field-Emitted Electrons
10.30Coffee Break
11.00Seminar Session VI: Electron Optics Aplications
 Feinäugle Peter: Electron-Optical Investigations on Cold Cathode Electron Beam Sources for High-Rate PVD
 Jiruše Jaroslav: Formation and Vizualization of Nanostructures with SEM/FIB
12.00Lunch
13.30Bustour with walk and culture plus a dinner in a rustic inn

Thursday June 3

08.30Breakfast
09.30Seminar Session VII: Electron and Ion Optical Computations I
 Munro Eric: Simulation of Curved Axis Systems, Omega Filters, Beam Separators and Electron Mirrors
 Ohnweiler Timm: Impact of a Beam Limiting Aperture on Coulomb Interactions in a Low-Voltage Focussed Ion Beam System
 Preikszas Dirk: Optimization of the Collection Efficiency of Secondary Ions for Spatially Resolved SIMS in Crossbeam Devices
11.00Coffee Break
11.30Seminar Session VIII: Electron and Ion Optical Computations II
 Radlička Tomáš: Properties of Bi LMIS with Ion Clusters
 Oral Martin: Ray Tracing, Aberration Coefficients and Intensity Distribution
 Lencová Bohumila: Recent Developments and Improvements of EOD Program
13.00Lunch
14.30Seminar Session XI: Aberation Correction
 Müller Heiko: Improved Aberration Correctors for the Conventional and the Scanning Transmission Electron Microscope
 Rose Harald: Outline of an Aberration-Corrected Low-Voltage Phase Electron Microscope
15.30Coffee Break
16.00Seminar Session X: Discussion of Future Trends and Conclusions
17.30Concert
19.00Farewell Dinner

Friday June 4

07.00Breakfast
 Departure
ORAL PRESENTATIONS AND POSTERS
Oral presentations:
De Pietro Lorenzo: High Resolution Electron Microscopy via Localized Field-Emitted Electrons
Feinäugle Peter: Electron-Optical Investigations on Cold Cathode Electron Beam Sources for High-Rate PVD
Hovorka Miloš: Prospects of the Scanning Low Energy Electron Microscopy in Materials Science
Hovorka Miloš: Mapping of Dopants by Electron Injection
Jiruše Jaroslav: Formation and Vizualization of Nanostructures with SEM/FIB
Lencová Bohumila: Recent Developments and Improvements of EOD Program
Mika Filip: Imaging of Dopants under Presence of Surface Ad-layers
Matsuda Kenji: Superconductive Property and Microstructure of MgB2 / Al Composite Materials
Munro Eric: Simulation of Curved Axis Systems, Omega Filters, Beam Separators and Electron Mirrors
Müller Heiko: Improved Aberration Correctors for the Conventional and the Scanning Transmission Electron Microscope
Müllerová Ilona: Transmission Mode in Scanning Low Enery Electron Microscope
Ohnweiler Timm: Impact of a Beam Limiting Aperture on Coulomb Interactions in a Low-Voltage Focussed Ion Beam System
Oral Martin: Tracing, Aberration Coefficients and Intensity Distribution
Pokorná Zuzana:Mapping the Local Density of States Above Vacuum Level by Low Energy Electron Reflectivity
Preikszas Dirk: Optimization of the Collection Efficiency of Secondary Ions for Spatially Resolved SIMS in Crossbeam Devices
Radlička Tomáš: Properties of Bi LMIS with Ion Clusters
Rodenburg Cornelia: Energy Selective Secondary Electron Detection a Solution to Site Specific SEM Dopant Mapping
Rodenburg John: Transmission and Reflection Microscopy Without Lenses
Rose Harald: Outline of an Aberration-Corrected Low-Voltage Phase Electron Microscope
Sato Kazuhisa: Nanostructure and Morphology of Wood Carbon Observed by Low-Voltage Electron Microscopy

Posters:
Horáček Miroslav:Modification of the Schottky Fe ZrO/W Electron Emitter
Konvalina Ivo:Electron Optical Properties of the Cathode Lens Combined with a Focusing Magnetic/Immersion-Magnetic Lens
Matějka Milan:Comparison of Techniques for Diffraction Grating Topography Analysis
Mikmeková Šárka:Prospects of the Scanning Low Energy Electron Microscopy in Materials Science
Roland Janzen:Electrostatic Hexapole Corrector for Reduction of Spherical Aberration Within Miniaturised Columns
Urbánek Michal:Determination of Proximity Effect Forward Scattering Range Parameter in E-beam Lithography
Zobačová JitkaImaging of Thermal Treated Thin Films on Si Substrate in the Scanning Low Energy Electron Microscope
ORGANIZING COMMITTEE
Dr. Filip Mika, Dr. Ilona Müllerová, Dr. Luděk Frank, Prof. Bohumila Lencová, Dr. Ivo Konvalina, Mgr. Zuzana Pokorná, Mgr. Miloš Hovorka